Microscope Lamps and Accessories
Electron Microscopy Sciences Cross Line Scale Reticle RET 21, 21 mm, 20 mm Scale, 0.10 mm Divisions
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 21 mm
Scale: 20 mm
Divisions: 0.10 mm
Electron Microscopy Sciences Cross Scale Reticle RET 32, 19 mm, 20 mm Scale, 0.10 mm x 200 Divisions
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 19 mm
Scale: 20 mm
Divisions: 0.10 mm x 200
Electron Microscopy Sciences Grain Sizing Reticle NG60, 23 mm
For the determination of non-metallic inclusion content of steel. NG60 meets EN 10247 and NG61 Meets ISO 4976. Both are scaled for use eith 10x objective magnification Pattern
Size: 23 mm
Method: EN 10247
Electron Microscopy Sciences Grain Sizing Reticle NG60, 24.5 mm
For the determination of non-metallic inclusion content of steel. NG60 meets EN 10247 and NG61 Meets ISO 4976. Both are scaled for use eith 10x objective magnification Pattern
Size: 24.5 mm
Method: EN 10247
Electron Microscopy Sciences Grain Sizing Reticle NG61, 21 mm
For the determination of non-metallic inclusion content of steel. NG60 meets EN 10247 and NG61 Meets ISO 4976. Both are scaled for use eith 10x objective magnification Pattern
Size: 21 mm
Method: ISO 4967
Electron Microscopy Sciences Athene Multiple Slots Grid, Copper
Athene grids are renowned for the highest quality standards, exceptionally refined grid bars, and good handling characteristics. 3.05 mm diameter.
Material: Copper
Electron Microscopy Sciences JEOL SEM Cylinder Mount 2" surface, 3/8" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 2"
Height: 3/8"
Electron Microscopy Sciences Grain Sizing Reticle NG61, 27 mm
For the determination of non-metallic inclusion content of steel. NG60 meets EN 10247 and NG61 Meets ISO 4976. Both are scaled for use eith 10x objective magnification Pattern
Size: 27 mm
Method: ISO 4967
Electron Microscopy Sciences Shorter Pin SEM Stub Slotted 18 mm Head with 6 mm Pin, Aluminum, 3.2 mm Pin diameter
SEM specimen mount with shorter pin and slotted head for use with all Zeiss/LEO SEM, FESEM & FIB systems. Made from ultra-pure aluminum with a standard lathe finish.
Head: 18 mm
Pin height: 6 mm
Pin diameter: 3.2 mm
Electron Microscopy Sciences Shorter Pin SEM Stub Slotted 18 mm Head with 6 mm Pin, Aluminum, 3.2 mm Pin diameter
SEM specimen mount with shorter pin and slotted head for use with all Zeiss/LEO SEM, FESEM & FIB systems. Made from ultra-pure aluminum with a standard lathe finish.
Head: 18 mm
Pin height: 6 mm
Pin diameter: 3.2 mm
Electron Microscopy Sciences Standard Pin SEM Stub 3-Division 18 mm Head with 9 mm Pin, Aluminum, 3.2 mm Pin diameter
Pin stub mount with 3 divisions for use with FEI, Phillips, LEO, Zeiss, Cambridge, Leica, Amray, Tescan and Camscan SEMs. Made from ultra-pure aluminum with a standard lathe finish.
Head: 18 mm
Pin height: 9 mm
Pin diameter: 3.2 mm
Electron Microscopy Sciences JEOL SEM Cylinder Mount 1" surface, 3/8" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1"
Height: 3/8"
Electron Microscopy Sciences Howard Thick Coverglass, 28 x 33x1mm thick
For use with counting chambers.
Size: 28 x 33 x 1 mm thick
Electron Microscopy Sciences Concentric Circles Microscope Graticle NE44, 21 mm, 10 circles 1 mm-10 mm
Can be used for two-way measurement when calibrated as a micrometer. There are 10 concentric circles 1mm-10mm in diameter. Surface chrome image.
Size: 21 mm